Dynamic magnetic information storage or retrieval – Checking record characteristics or modifying recording...
Reexamination Certificate
2007-07-24
2007-07-24
Wellington, Andrea (Department: 2627)
Dynamic magnetic information storage or retrieval
Checking record characteristics or modifying recording...
C360S053000
Reexamination Certificate
active
11120114
ABSTRACT:
A nonlinearity measuring method capable of measuring NLTS with a higher precision while taking the state of magnetization inversion of a preceding bit string into consideration. A constitution includes a first measuring section measuring a first predetermined higher harmonic component from a regenerated signal of the reference signal magnetically recorded on a medium, a second measuring section measuring a second predetermined higher harmonic component from regenerated signals with respect to plural kinds of signals to be measured magnetically recorded on the medium, and a calculating section calculating NLTS from the first component and the second component corresponding to each of the signals, wherein each of plural kinds of signals to be measured includes a magnetization inversion pattern string P1preceding the objective bit to be measured of NLTS; thereby NLTS depending on the string P1can be quantitatively measured easily.
REFERENCES:
patent: 5068754 (1991-11-01), Garde
patent: 5262904 (1993-11-01), Tang et al.
patent: 5583705 (1996-12-01), Ziperovich et al.
patent: 5781358 (1998-07-01), Hasegawa
patent: 5784296 (1998-07-01), Baker et al.
patent: 6934100 (2005-08-01), Ueno
patent: 2002/0105744 (2002-08-01), Ueno
patent: 10-172105 (1998-06-01), None
patent: 2975323 (1999-09-01), None
patent: 2002-230709 (2002-08-01), None
Y. Tang et al.; “A Technique for Measuring Nonlinear Bit Shift”; IEEE Trans. on Mag., vol. 27, No. 6, pp. 5316-5318; Nov. 1991.
X. Che et al.; “A Generalized Frequency Domain Nonlinearity Measurement Method”; IEEE Trans. on Mag., Vo. 30, No. 6; Jun. 1994.
A. Taratorin et al.; “Non-linear Interactions in a Series of Transitions”; IEEE Trans. on Mag., Vo. 33, No. 1; Aug. 1996.
Fujitsu Limited
Greer Burns & Crain Ltd.
Kapadia Varsha A.
Wellington Andrea
LandOfFree
Nonlinearity measuring method, nonlinearity measuring unit,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nonlinearity measuring method, nonlinearity measuring unit,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nonlinearity measuring method, nonlinearity measuring unit,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3745315