Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-11-14
2010-06-15
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07739063
ABSTRACT:
A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling.
REFERENCES:
patent: 6920407 (2005-07-01), Adamian et al.
patent: 2003/0102907 (2003-06-01), Tasker et al.
K. Kurokawa, “Power Waves and the Scattering Matrix”, IEEE Transactions on Microwave Theory and Techniques,, vol. 13, pp. 194-202, 1965.
U. Lott,“Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports” IEEE Transactions on Microwave Theory and Techniques, vol. 37, pp. 1506-1511, 1989.
T. Van den Broeck and J. Verspecht, “Calibrated vectorial nonlinear-network analyzers”, IEEE MTT-S International Microwave Symposium Digest, pp. 1069-1072, May 1994.
P.S. Blockley, D, Gunyan, J.B. Scott, “Mixer-based, vector-corrected, vector signal
etwork analyzer offering 300kHz-20GHz bandwidth and traceable phase response”, IEEE MTT-S International Microwave Symposium Digest, pp. 4,, Jun. 2005.
W. Kruppa, K. F. Sodomsky, “An Explicit Solution for the Scattering Parameters of a Linear Two-Port Measured with an Imperfect Test Set (Correspondence),” IEEE Transactions on Microwave Theory and Techniques, vol. 19, No. 1, pp. 122-123, Jan. 1971.
S. Rehnmark, “On the Calibration Process of Automatic Network Analyzer Systems (Short Papers),” IEEE Transactions on Microwave Theory and Techniques, vol. 22, No. 4, pp. 457-458, Apr. 1974.
R. B. Marks, “Formulations of the basic vector network analyzer error model including switch terms,” in 50th ARFTG Conf. Dig., Dec. 1997, pp. 115-126.
Betts Loren C.
Gunyan Daniel B.
Agilent Technologie,s Inc.
Bobys Marc
Cherry Stephen J
Dunn Drew A
LandOfFree
Nonlinear measurement system error correction does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Nonlinear measurement system error correction, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nonlinear measurement system error correction will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4239906