X-ray or gamma ray systems or devices – Source support – Source cooling
Reexamination Certificate
2005-10-25
2005-10-25
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Source support
Source cooling
C378S200000
Reexamination Certificate
active
06957913
ABSTRACT:
An x-ray technique-based nonintrusive inspection apparatus is provided which is capable of inspecting 600 containers an hour which is small, and which is easily maintainable. Features of the apparatus include “radiation locking” with “active curtains”, “continuous scanning” utilizing an x-ray line scanner subsystem and a CT scanner subsystem, good structural integrity, radiation containment in a self-shielding manner, an easily maintainable driving arrangement, shielding curtains that can be raised and lowered quickly, a container jam release mechanism, and efficient air conditioning.
REFERENCES:
patent: 4020346 (1977-04-01), Dennis
patent: 4239969 (1980-12-01), Haas et al.
patent: 4465540 (1984-08-01), Albert
patent: 4495636 (1985-01-01), Jacobs et al.
patent: 4879735 (1989-11-01), Owens
patent: 5124554 (1992-06-01), Fowler et al.
patent: 5182764 (1993-01-01), Peschmann et al.
patent: 5479021 (1995-12-01), Morgan et al.
patent: 5610968 (1997-03-01), Deucher et al.
patent: 5754617 (1998-05-01), Itoh
patent: 5901198 (1999-05-01), Crawford et al.
patent: 5974111 (1999-10-01), Krug et al.
patent: 5982843 (1999-11-01), Bailey et al.
patent: WO 98/58389 (1998-12-01), None
patent: PCT/US99/28229 (1999-11-01), None
Baylis William H.
Kresse David E.
Mesqui François A.
Renkart Gerhard
Blakely & Sokoloff, Taylor & Zafman
De Klerk Stephen M.
Glick Edward J.
InVision Technologies, Inc.
Song Hoon
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