Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1990-12-21
1992-09-08
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
356359, 73656, G01B 902
Patent
active
051462893
ABSTRACT:
An object is tested for defects by interferometry, by comparing images of the object taken under stressed and unstressed conditions. The stress is applied by perturbing the object with acoustic waves, produced by a speaker directed towards the object, without any mechanical coupling to the object. The acoustic energy can be of a single frequency, or it can be distributed over a set of random frequencies (i.e. white noise), or it can be in the form of a signal which is "swept" through a range of frequencies. In the latter case, the results can be stored in a video buffer which records the maximum signal obtained, for each pixel, while the signal is swept through the frequency range. Different defects in the object may resonate at varying frequencies within the given range. By exciting the object at each frequency within the range, and superimposing the maximum signals obtained for each pixel, the resulting image is likely to show all the locations on the object which may be defective. The preferred form of interferometry is electronic shearography, which is particularly suitable for recording interference patterns in a video buffer. The present invention is especially useful in detecting delaminations in bonded articles, and is particularly advantageous in testing large objects.
REFERENCES:
patent: 3645129 (1972-02-01), Grant
patent: 3828126 (1974-08-01), Ramsey, Jr.
patent: 4408881 (1983-10-01), Clarady
Eilberg William H.
Kurtz, II Richard E.
Laser Technology, Inc.
Turner Samuel A.
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