Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1985-02-07
1987-01-20
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
With polariscopes
356239, G01N 2121
Patent
active
046377263
ABSTRACT:
A wafer is positioned in a magnetic field. A computer initializes the light level and the electronic gain of each detector preamp associated with a fiber optic link from the analyzer. The magnetic field direction would then be reversed by computer command. This would cause a localized change in intensity of light passing through the wafer, due to Faraday Rotation (FR). The resulting change in detector output together with location and wavelength data could be used to compute a map of the wafer.
REFERENCES:
patent: 4498780 (1985-02-01), Banno et al.
patent: 4559451 (1985-12-01), Curl
Smith, "Nonvisual Measurement of Collapse Field in Small-Bubble Garnets", v. Sci. Instrum., vol. 52, No. 11, pp. 1737-1748, 11/81.
Tanton George A.
Walker Clifford G.
Bush Freddie M.
Koren Matthew W.
Sims Robert C.
The United States of America as represented by the Secretary of
Willis Davis L.
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