X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1993-09-08
1995-05-23
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 73, 378 81, 378 74, G01N 2320
Patent
active
054188288
ABSTRACT:
A nondestructive method, and associated apparatus, are provided for determining the grain flow of the grains in a convex curved, textured polycrystalline surface. The convex, curved surface of a polycrystalline article is aligned in a horizontal x-ray diffractometer and a monochromatic, converging x-ray beam is directed onto the curved surface of the polycrystalline article so that the converging x-ray beam is diffracted by crystallographic planes of the grains in the polycrystalline article. The diffracted x-ray beam is caused to pass through a set of horizontal, parallel slits to limit the height of the beam and thereafter. The linear intensity of the diffracted x-ray is measured, using a linear position sensitive proportional counter, as a function of position in a direction orthogonal to the counter so as to generate two dimensional data. An image of the grains in the curved surface of the polycrystalline article is provided based on the two-dimensional data.
REFERENCES:
patent: 4223219 (1980-09-01), Born et al.
patent: 4364122 (1982-12-01), Wolfel et al.
B. K. Tanner, "X-Ray Diffraction Topography," Pergamon Press, New York, N (1976).
A. Taylor, "X-Ray Metallotraphy," John Wiley & Sons, Inc., New York London (1961).
L. Le Naour, "X-Ray Topography of Uranium Alloys," ORNL-tr-5069, (translated from the French CEA Report, CEA-R-3494), Union Carbide Corp., Nuclear Div., ORNL (May 1968).
Y. Chikauro et al, "Ploycrystal Scattering Topography," J. Applied Crystallography, 15,48 (1982).
Breeden David E.
Hamel Stephen D.
Moser William R.
Porta David P.
The United States of America as represented by the Department of
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