Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-09-27
2005-09-27
Wu, Jingge (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C356S237200, C356S369000
Reexamination Certificate
active
06950545
ABSTRACT:
The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.
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English language translation of JP 11-108759 to Sakai et al. cited by applicant.
Asano Toshio
Katsuta Daiske
Nomoto Mineo
Sakai Kaoru
Taguchi Tetsuo
Hesseltine Ryan J.
Hitachi , Ltd.
Townsend and Townsend / and Crew LLP
Wu Jingge
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