Nondestructive inspection method and apparatus

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S237200, C356S369000

Reexamination Certificate

active

06950545

ABSTRACT:
The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.

REFERENCES:
patent: 4648053 (1987-03-01), Fridge
patent: 5039868 (1991-08-01), Kobayashi et al.
patent: 5047851 (1991-09-01), Sauerwein et al.
patent: 5301248 (1994-04-01), Takanori et al.
patent: 5570431 (1996-10-01), Gillard et al.
patent: 5625193 (1997-04-01), Broude et al.
patent: 6175092 (2001-01-01), Binette et al.
patent: 6683641 (2004-01-01), MacCracken et al.
patent: 6697514 (2004-02-01), Kobayashi et al.
patent: 58-082147 (1983-08-01), None
patent: 63225153 (1988-09-01), None
patent: 01109249 (1989-04-01), None
patent: 04 223262 (1992-08-01), None
patent: 05 107202 (1993-08-01), None
patent: 06-118062 (1994-04-01), None
patent: 06 300739 (1995-02-01), None
patent: 10 300688 (1999-02-01), None
patent: 11-108759 (1999-04-01), None
patent: WO 00/60344 (2000-10-01), None
English language translation of JP 11-108759 to Sakai et al. cited by applicant.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nondestructive inspection method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nondestructive inspection method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nondestructive inspection method and apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3395975

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.