Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-11-13
1988-10-18
Wan, Gene
Optics: measuring and testing
By polarized light examination
With light attenuation
356394, G01B 1124
Patent
active
047782749
ABSTRACT:
A noncontact measuring device has a generally L-shaped pivotable and rotatable probe means to be disposed along a straight portion of an object. Another noncontact measuring device has a rotatable probe means with an inverted L-shape to be disposed along a straight portion of an object. The probe of the former device projects a beam of light, while that of the latter device projects two beams of light. For either measuring device, when the beam or beams of light are being intercepted by the object, coordinates of a predetermined point of the probe means are read by a three-dimensional shape measuring apparatus to which the device is connected.
REFERENCES:
patent: 3944798 (1976-03-01), Eaton
Chuo Electric Manufacturing Co., Ltd.
Wan Gene
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