Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-04-05
2011-04-05
Schechter, Andrew (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C505S160000, C505S310000
Reexamination Certificate
active
07920977
ABSTRACT:
A noncontact method for measuring currents flowing through superconductive wires connected in parallel is provided. The method includes arranging hall sensors for measuring voltage levels based on magnetic fields generated around the superconductive wires, setting a matrix relation between the measured voltage values, values of currents flowing through the superconductive wires, and a variable matrix having variables defining relations between the voltage values and the current values, applying predetermined current levels to the superconductive wires a number of times and measuring voltage values through the hall sensors, substituting the predetermined current values and the measured voltage values into the matrix relation to calculate the variables of the variable matrix, and substituting the calculated variable matrix and unknown voltage values, measured by the hall sensors when unknown currents flow through the superconductive wires, into the matrix relation to calculate values of the unknown currents flowing through the superconductive wires.
REFERENCES:
patent: 6571183 (2003-05-01), Wellstood et al.
patent: 2002/0149331 (2002-10-01), Marcinkiewicz
Choi Kyeong Dal
Kim Woo Seok
Lee Ji Kwang
Lee Seung Wook
Park Chan
Huynh Phuong
Korea Polytechnic University
Park John K.
Park Law Firm
Schechter Andrew
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