Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1985-10-02
1989-01-17
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356381, 356385, G01B 1108, G01B 1124
Patent
active
047984694
ABSTRACT:
Methods and apparatus are provided for determining spatial characteristics of an object such as the size, shape and relative locations of selected portions of the object, by utilizing a noncontact gage system that directs light from a source such as colliminated a laser beam to illuminate a small area on selected portions of the object. Light that is reflected from the illuminated area is focused along a path that is intercepted by a light sensitive detector. The size of an illuminated spot that is formed on the detector is a function of the location of the reflecting surface portion of the object. An electrical signal is provided by the detector, with the signal having a characteristic which is representative of a feature of spot size, and hence is also representative of the location of the reflecting surface portion of the object. By determining relative locations of various features of an object, size and shape may be deduced. In preferred practice, electronic signal processing is utilized to sample the signal at rapid but regular spatial or timed intervals. Data may be stored and/or analyzed as an incident light beam is moved across selected surface portions of an object to cause the illuminated area to move like a probe to interrogate the object; alternatively, the object surface may move relative to the incident light beam. A microcomputer may be used to control system operation, to compare sensed values with predetermined values to ascertain whether features of the object conform to predetermined tolerances, to determine what additional machining may be required, and/or to monitor and control needed machining.
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Burge David A.
Evans F. L.
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