Non-volatile semiconductor memory device with memory transistor

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185200, C365S185220

Reexamination Certificate

active

07002846

ABSTRACT:
In the present flash memory a threshold voltage of a memory transistor to which data is written is detected and the detected value is used to set an initial value of a pulse voltage of a write pulse signal, and whenever the write pulse signal is applied, the pulse voltage is increased by a step voltage. The memory transistor's drain current and the threshold voltage's variation can be smaller than when a fixed pulse voltage is applied, as conventional.

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patent: 6807100 (2004-10-01), Tanaka
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patent: 10-228786 (1998-08-01), None
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patent: 2000-30476 (2000-01-01), None
patent: 2003-203488 (2003-07-01), None
U.S. Appl. No. 10/660,789, filed Sep. 12, 2004, Nitta, et al., “Nonvolatile Semiconductor Memory Device”.
U.S. Appl. No. 10/940,812, filed Sep. 15, 2004, Mitanl, et al., “Non-Volatile Semiconductor Memory Device Allowing Efficient Programming Operation and Erasing Operation in Short Period of Time”.

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