Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-02-21
2006-02-21
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185200, C365S185220
Reexamination Certificate
active
07002846
ABSTRACT:
In the present flash memory a threshold voltage of a memory transistor to which data is written is detected and the detected value is used to set an initial value of a pulse voltage of a write pulse signal, and whenever the write pulse signal is applied, the pulse voltage is increased by a step voltage. The memory transistor's drain current and the threshold voltage's variation can be smaller than when a fixed pulse voltage is applied, as conventional.
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U.S. Appl. No. 10/660,789, filed Sep. 12, 2004, Nitta, et al., “Nonvolatile Semiconductor Memory Device”.
U.S. Appl. No. 10/940,812, filed Sep. 15, 2004, Mitanl, et al., “Non-Volatile Semiconductor Memory Device Allowing Efficient Programming Operation and Erasing Operation in Short Period of Time”.
Agawa Daisuke
Kishida Satoru
Miyawaki Yoshikazu
Okimoto Hiromi
Hoang Huan
McDermott Will & Emery LLP
Renesas Technology Corp.
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