Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2011-07-05
2011-07-05
Auduong, Gene N. (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185200
Reexamination Certificate
active
07974135
ABSTRACT:
A non-volatile semiconductor memory device including a NAND cell unit with a plurality of electrically rewritable and non-volatile memory cells connected in series, one end thereof being coupled to a bit line via a first select gate transistor while the other end is coupled to a source line via a second select gate transistor, wherein the memory device has an erase-verify mode for verifying an erase state of the memory cells in the NAND cell unit, the erase-verify mode including two verify-read operations adapted according to cell ranges to be erase-verified in the NAND cell unit.
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Auduong Gene N.
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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