Non-volatile semiconductor memory

Static information storage and retrieval – Floating gate – Particular biasing

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Details

36518522, 36518529, G11C 1604, G11C 1606

Patent

active

060260238

ABSTRACT:
A non-volatile semiconductor memory includes a reference voltage generating circuit including a series circuit formed of a resistor and a diode, and a constant current circuit for supplying a constant current having a temperature dependency different from that of the diode, to the series circuit, so as to generate at one end of the series circuit a reference voltage having a temperature dependency equivalent to that of the threshold voltage of an erased memory cell. An erase verify voltage generating circuit generates on the basis of the reference voltage an erase verify voltage having a temperature dependency equivalent to that of the threshold voltage of the erased memory cell, and a read voltage generating circuit generates on the basis of the reference voltage a read voltage having a temperature dependency equivalent to that of the threshold voltage of the erased memory cell. Thus, a margin enough to realize a high speed reading can be ensured between the read voltage and the erase verify voltage, regardless of a temperature variation.

REFERENCES:
patent: 5579262 (1996-11-01), Song
patent: 5615153 (1997-03-01), Yiu et al.
patent: 5864504 (1999-01-01), Tanzawa et al.

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