Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate
2008-01-16
2010-11-30
Hur, J. H. (Department: 2824)
Static information storage and retrieval
Floating gate
Particular connection
C365S185240, C365S185290, C365S185180
Reexamination Certificate
active
07843730
ABSTRACT:
A method including performing a program/erase cycle on a first non-volatile memory (NVM) bit of an integrated circuit using a first fluence, wherein the first NVM bit has a first transconductance is provided. The method further includes performing a program/erase cycle on a second NVM bit of the integrated circuit using a second fluence, wherein the second NVM bit has a second transconductance, and wherein the first transconductance is greater than the second transconductance and the second fluence is greater than the first fluence.
REFERENCES:
patent: 4758988 (1988-07-01), Kuo
patent: 5367484 (1994-11-01), Alexander et al.
patent: 5926416 (1999-07-01), Beverina et al.
patent: 6081447 (2000-06-01), Lofgren et al.
patent: 6363014 (2002-03-01), Fastow
patent: 7130223 (2006-10-01), Ishimaru et al.
patent: 7133313 (2006-11-01), Shih
patent: 7167392 (2007-01-01), Poplevine et al.
patent: 7170795 (2007-01-01), Lee
patent: 7209387 (2007-04-01), Yip
patent: 7215577 (2007-05-01), Liu et al.
patent: 2002/0028541 (2002-03-01), Lee et al.
patent: 2002/0118570 (2002-08-01), Iijima
patent: 2007/0053222 (2007-03-01), Niset et al.
patent: 2007/0064482 (2007-03-01), Takeuchi
PCT/US2009/0300080 International Search Report and Written Opinion.
Clingan, Jr. James L.
Freescale Semiconductor Inc.
Hur J. H.
Vo Kim-Marie
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