Non-volatile memory system having automatic cycling test functio

Details Non-volatile memory system having automatic cycling test functio Non-volatile memory system having automatic cycling test functio

1995-07-28

1998-05-12

Beausoliel, Jr., Robert W.

Static information storage and retrieval

Magnetic bubbles

Guide structure

365201, G01R 3128

Patent

active

057519447

ABSTRACT:
A flash memory system having the capability of automatically executing consecutive program-erase cycles for the purpose of measuring the endurance of the memory. The memory system may be switched to a test mode which triggers the autocycling by applying a high voltage to two of the package pins of the system which normally are coupled to low voltage sources. The system includes an internal state machine which, in normal operation, is implemented to perform flash cell programming, erasing and reading, with the erasing sequence including a preprogram step where, prior to the erase, all cells are programmed. When placed in the autocycle mode by application of the high voltages to the pins, the state machine is caused to enter the erase sequence, including the preprogram step. Once the first erase sequence is concluded, circuitry is provided that causes the state machine to automatically initiate a further erase sequence. The erase sequences will continue until interrupted, with each sequence constituting a single program-erase cycle.

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patent: 5414829 (1995-05-01), Fandrich et al.
patent: 5544123 (1996-08-01), Hoshi et al.

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