Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-06-21
2005-06-21
Phan, Trong (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185190, C365S185330
Reexamination Certificate
active
06909638
ABSTRACT:
Each cell of a memory is programmed by first using a source bias that is typically effective for programming the cells. If a cell is not successfully programmed in the first attempt, that is typically because a number of cells on the same column as that of the cell that did not successfully program have a relatively low threshold voltage, a low enough threshold voltage that these memory cells are biased, even with grounded gates, to be conductive. The vast majority of the cells do not have this problem, but it is common for there to be a few memory cells that do have this low threshold voltage characteristic. To overcome this, a different source bias is applied during subsequent programming attempts. Thus, the vast majority of the cells are programmed at the faster programming condition, and only the few that need it are programmed using the slower approach.
REFERENCES:
patent: 4888735 (1989-12-01), Lee et al.
patent: 5923585 (1999-07-01), Wong et al.
patent: 6046932 (2000-04-01), Bill
patent: 6275415 (2001-08-01), Haddad
patent: 6285589 (2001-09-01), Kajitani
patent: 6381177 (2002-04-01), De Sandre et al.
patent: 6396738 (2002-05-01), Tamada et al.
patent: 6768676 (2004-07-01), Hirano
Chindalore Gowrishankar L.
Choy Jon S.
Clingan, Jr. James L.
Dolezal David G.
Freescale Semiconductor Inc.
Phan Trong
LandOfFree
Non-volatile memory having a bias on the source electrode... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-volatile memory having a bias on the source electrode..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-volatile memory having a bias on the source electrode... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3503808