Non-volatile memory device having built-in test pattern generato

Details Non-volatile memory device having built-in test pattern generato Non-volatile memory device having built-in test pattern generato

1993-03-23

1997-10-28

Nguyen, Hoa T.

Excavating

371 27, G11C 2900, G01R 3128

Patent

active

056823894

ABSTRACT:
A non-volatile memory device has a built-in test pattern generator used during diagnostics of control signal lines. An internal test pattern generator supplies a test pattern to digit lines so that short circuit between decoded signal lines to a column selector changes the internal test pattern, thereby effectively screening out a defective product. Digit lines of the memory device are sequentially coupled through the column selector with a sense amplifier circuit in a diagnostic operation to see whether or not any defective component is incorporated therein.

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patent: 5241501 (1993-08-01), Tanaka
patent: 5267212 (1993-11-01), Takashima

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