Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2005-12-13
2005-12-13
Le, Thong Q. (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185260
Reexamination Certificate
active
06975545
ABSTRACT:
A memory cell includes an N-type well, three P-type doped regions, a first stacked dielectric layer, a first gate, a second stacked dielectric layer, and a second gate. The three P-type doped regions are formed on the N-well. The first dielectric stack layer is formed on the N-type well and between the first doped region and the second doped region from among the three P-type doped regions. The first gate is formed on the first stacked dielectric layer. The second stacked dielectric layer is formed on the N-type well and between the second doped region and the third doped region from among the three P-type doped regions. The second gate is formed on the second stacked dielectric layer.
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Chen Hsin-Ming
Hsu Ching-Hsiang
Lee Hai-Ming
Shen Shih-Jye
e-Memory Technology, Inc.
Hsu Winston
Le Thong Q.
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