Non-volatile memory and method with control gate...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185230, C365S185030, C365S185210

Reexamination Certificate

active

07391646

ABSTRACT:
Source line bias is an error introduced by a non-zero resistance in the ground loop of the read/write circuits. During sensing the source of a memory cell is erroneously biased by a voltage drop across the resistance and results in errors in the applied control gate and drain voltages. This error is minimized when the applied control gate and drain voltages have their reference point located as close as possible to the sources of the memory cells. In one preferred embodiment, the reference point is located at a node where the source control signal is applied. When a memory array is organized in pages of memory cells that are sensed in parallel, with the sources in each page coupled to a page source line, the reference point is selected to be at the page source line of a selected page via a multiplexor.

REFERENCES:
patent: 4357685 (1982-11-01), Daniele et al.
patent: 5070032 (1991-12-01), Yuan et al.
patent: 5095344 (1992-03-01), Harari
patent: 5172338 (1992-12-01), Mehrotra et al.
patent: 5313421 (1994-05-01), Guterman et al.
patent: 5315541 (1994-05-01), Harari et al.
patent: 5343063 (1994-08-01), Yuan et al.
patent: 5418752 (1995-05-01), Harari et al.
patent: 5453955 (1995-09-01), Sakui et al.
patent: 5570315 (1996-10-01), Tanaka et al.
patent: 5595924 (1997-01-01), Yuan et al.
patent: 5661053 (1997-08-01), Yuan
patent: 5689470 (1997-11-01), Inoue
patent: 5768192 (1998-06-01), Eitan
patent: 5774397 (1998-06-01), Endoh et al.
patent: 5903495 (1999-05-01), Takeuchi et al.
patent: 6011725 (2000-01-01), Eitan
patent: 6046935 (2000-04-01), Takeuchi et al.
patent: 6055190 (2000-04-01), Lu et al.
patent: 6118702 (2000-09-01), Shieh et al.
patent: 6125052 (2000-09-01), Tanaka et al.
patent: 6222762 (2001-04-01), Guterman et al.
patent: 6373753 (2002-04-01), Proebsting
patent: 6987693 (2006-01-01), Cernea et al.
patent: 7023736 (2006-04-01), Cernea et al.
patent: 7046568 (2006-05-01), Cernea et al.
patent: 7170784 (2007-01-01), Cernea et al.
patent: 2004/0057287 (2004-03-01), Cernea et al.
patent: 2004/0057318 (2004-03-01), Cernea et al.
patent: 2004/0109357 (2004-06-01), Cernea et al.
patent: 2005/0169082 (2005-08-01), Cernea et al.
Eitan et al., “NROM: A Novel Localized Trapping, 2-Bit Nonvolatile Memory Cell,” IEEE Electron Device Letters, vol. 21, No. 11, Nov. 2000, pp. 543-545.
EPO/ISA, “Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration,” mailed in corresponding International Application No. PCT/US2006/011675 on Jul. 26, 2006, 10 pages.
EPO/ISA, “Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority, or the Declaration,” mailed in corresponding International Application No. PCT/US2006/011824 on Aug. 25, 2006, 11 pages.
USPTO, “Office Action,” mailed in related U.S. Appl. No. 11/624,617 on Jul. 20, 2007, 7 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-volatile memory and method with control gate... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-volatile memory and method with control gate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-volatile memory and method with control gate... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2804329

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.