Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2007-11-06
2007-11-06
Huynh, Andy (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S003000, C257S005000, C257SE27004, C257SE45002
Reexamination Certificate
active
10967222
ABSTRACT:
A non-volatile memory (1) which comprises an insulating substrate (11) having a plurality of first electrodes (15) extending therethrough from a front surface of the substrate to a rear surface thereof, a second electrode (12) formed on one surface side of the substrate (11), and a recording layer (14) held between the first electrodes (15) and the second electrode (12) and variable in resistance value by electric pulses applied across the first electrodes (15) and the second electrode (12), the plurality of first electrodes (15) being electrically connected to the recording layer (14) in a region constituting a single memory cell (MC). The non-volatile memory (1) can be reduced in power consumption and has great freedom of design and high reliability.
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Berggren et al., Paper electronics and electronic paper, Oct. 2001, IEEE.
Morimoto Kiyoshi
Morita Kiyoyuki
Ohtsuka Takashi
Tanaka Hideyuki
Huynh Andy
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
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