Non volatile data storage through dielectric breakdown

Details Non volatile data storage through dielectric breakdown Non volatile data storage through dielectric breakdown

2008-01-22

2008-01-22

Nguyen, VanThu (Department: 2824)

Static information storage and retrieval

Read only systems

Capacitative

C365S094000, C365S149000, C365S189090

Reexamination Certificate

active

07321502

ABSTRACT:
A method is described that induced dielectric breakdown within a capacitor's dielectric material while driving a current through the capacitor. The current is specific to data that is being written into the capacitor. The method also involves reading the data by interpreting behavior of the capacitor that is determined by the capacitor's resistance, where, the capacitor's resistance is a consequence of the inducing and the driving.

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