Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2006-04-25
2006-04-25
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By polarized light examination
C356S327000
Reexamination Certificate
active
07034938
ABSTRACT:
A Non-Scanning Computed Tomography Imaging Spectropolarimeter (NS-CTISP) measures all spatial, spectral and polarimetric information simultaneously in an image scene allowing measurement of dynamically changing scenes. In particular, NS-CTISP uses division of aperture to polarimetrically analyze each divided image, all of which are thereafter diffracted to measure irradiance on a focal plane array. The Stokes object cube data for each voxel is thereafter estimated from an inverse of the voxel polarimetric calibration matrix for the optical components.
REFERENCES:
patent: 5729011 (1998-03-01), Sekiguchi
patent: 6177992 (2001-01-01), Braun et al.
Foster Michael S.
Hoffman Andrew L.
Miles Brian H.
Lambert Richard A.
Lauchman Layla G.
The United States of America as represented by the Secretary of
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