Data processing: structural design – modeling – simulation – and em – Electrical analog simulator – Of electrical device or system
Reexamination Certificate
2007-05-08
2007-05-08
Frejd, Russell (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Electrical analog simulator
Of electrical device or system
C703S002000, C703S001000, C702S057000, C315S182000
Reexamination Certificate
active
10747087
ABSTRACT:
A non-linear test load is provided for calibrating a plasma system. The test load is a substrate for modeling the electrical characteristics of the plasma such that multi frequency testing can be performed in the absence of a plasma reaction. An exemplary substrate includes a first semiconductor junction for providing a non-linear response to the multi-frequency RF source provided from the anode. The first semiconductor junction exhibits a first capacitance for modeling a first plasma sheath of the anode. A plasma component is responsive to the first semiconductor junction and exhibits a resistance for modeling a resistance of the plasma, an inductance for modeling an inductance of the plasma, and a gap capacitance for modeling capacitance of the plasma. A second semiconductor junction is responsive to the plasma component for providing a non-linear response to the multi-frequency RF source provided from the plasma component, the second semiconductor junction exhibits a second capacitance for modeling a second plasma sheath of the cathode.
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Parsons Richard
Quon Bill H.
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