Non-invasive, low pin count test circuits and methods...

Details Non-invasive, low pin count test circuits and methods... Non-invasive, low pin count test circuits and methods...

2009-03-17

2010-10-05

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07808263

ABSTRACT:
An integrated circuit including at least one internal operational block, which includes test control circuitry for initiating a test mode and testing circuitry for verifying an operation of the integrated circuit under a more stringent condition in the test mode as compared to a condition in another operating mode such that proper operation of the integrated circuit is assured in the another operating mode. Pin control circuitry selectively outputs a test signal from a selected pin in the test mode indicative of the operation of the internal block, wherein the selected pin is utilized for exchanging another signal when the integrated circuit is in the another operating mode.

REFERENCES:
patent: 5384533 (1995-01-01), Tokuda et al.
patent: 6118293 (2000-09-01), Manhaeve et al.
patent: 6759863 (2004-07-01), Moore

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