Non-invasive, low pin count test circuits and methods

Details Non-invasive, low pin count test circuits and methods Non-invasive, low pin count test circuits and methods

2006-04-25

2009-12-29

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07639002

ABSTRACT:
A method of testing an integrated circuit including a plurality of test nodes includes initiating a test mode and, during a first time interval of the test mode, stepping a level of a supply current of the integrated circuit to a calibration level. Parameters are observed at the plurality of test nodes to detect errors during a second time interval of the test mode and the level of the supply current selectively stepped in response to a number of errors detected. The level of the supply current is decoded to identify the detected errors.

REFERENCES:
patent: 5559454 (1996-09-01), Schneider
patent: 5999008 (1999-12-01), Currin et al.
patent: 6320275 (2001-11-01), Okamoto et al.
patent: 6327545 (2001-12-01), Browen et al.

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