Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-30
2005-08-30
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06937046
ABSTRACT:
A method of testing an integrated circuit including the steps of observing a selected parameter at a selected test mode to detect an error. The current to the integrated circuit is stepped from a reference level by selected amount.
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patent: 6420880 (2002-07-01), Miller
Ammisetti Prasad
Kejariwal Murari
Melanson John Laurence
Thomsen Axel
Cirrus Logic Inc.
Murphy James J.
Nguyen Tung X.
Nguyen Vinh
Thompson & Knight LLP
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