Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Patent
1995-06-06
1996-12-31
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
324642, 324529, 324533, G01R 3111
Patent
active
055897762
ABSTRACT:
A method of non-intrusive testing of a terminal resistor on a data bus includes inserting a signal onto the data bus adjacent one end thereof by magnetically coupling a signal generator to the data bus and producing a signal of known repetition rate and amplitude in the data bus. The reflection of the signal from the end of the data bus is observed electronically, and the amplitude and phase of the reflected signal, if any, is determined to indicate whether the terminal resistor is correctly sized or correctly installed.
REFERENCES:
patent: 2148098 (1936-08-01), Manifold
patent: 2498755 (1946-08-01), Fulmer et al.
patent: 2548881 (1945-02-01), Ferrill, Jr.
patent: 2714706 (1951-07-01), Masters
patent: 2994848 (1958-08-01), Rayburn
patent: 3384852 (1966-02-01), Beck et al.
patent: 3521201 (1968-11-01), Veteran
patent: 3710282 (1973-01-01), Seinecke
patent: 4032881 (1977-06-01), Singleton
patent: 4199663 (1980-04-01), Herzog
patent: 4264827 (1981-04-01), Herzog
patent: 4325022 (1982-04-01), Pelletier
patent: 4393498 (1983-07-01), Jackson et al.
patent: 4471481 (1984-09-01), Shaw et al.
patent: 4472780 (1984-09-01), Chenoweth et al.
patent: 4484131 (1984-11-01), Jenkinson
patent: 4484213 (1984-11-01), Franklin
patent: 4513419 (1985-04-01), Small
patent: 4595923 (1986-06-01), McFarland, Jr.
patent: 4755929 (1988-07-01), Outous et al.
patent: 4795886 (1989-06-01), Carter
patent: 4823364 (1989-04-01), Herzog
patent: 4825450 (1989-04-01), Herzog
patent: 5121420 (1992-06-01), Marr
Carl L. Peters, Micorminiature Modular Structure, Nov. 1959.
H. Brueckmann, Delay-Line Dummy Load has High Power Rating Jun., 1954.
Solis Jose M.
The Boeing Company
Wieder Kenneth A.
LandOfFree
Non-intrusive testing of a terminal resistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-intrusive testing of a terminal resistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-intrusive testing of a terminal resistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1144392