Non-intrusive state observation of VLSI circuits using thermal a

Details Non-intrusive state observation of VLSI circuits using thermal a Non-intrusive state observation of VLSI circuits using thermal a

1997-05-14

1999-11-23

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G08B 2100

Patent

active

059906910

ABSTRACT:
An integrated circuit is set forth including a plurality of circuit elements interconnected by conductors and at least one resistive element operably connected to a location within the circuit. Upon an event occurring at the location, such as the activation of a circuit element, current is passed through the resistive element thereby elevating the temperature of the resistive element to cause incandescence so as to permit optical detection of the event.

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