Non-interlaced interline transfer CCD image sensing device with

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

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257233, 257236, 257243, 257248, 257250, H01L 2978, H01L 2716, H01L 3100

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active

052351980

ABSTRACT:
An interline transfer type area image sensor which operates in a non-interlaced mode and has an array of columns and rows of photoreceptor in which charge from each pixel is transferred into a stage of a vertical two-phase CCD shift register formed by adjacent electrodes of the CCD. Each electrode of a stage has a separate voltage clock. An ion implanted vertical transfer barrier region is formed under an edge of each electrode.

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patent: 4608749 (1986-09-01), Harada et al.
patent: 4613402 (1986-09-01), Losee et al.
patent: 4638361 (1987-01-01), Takeshita
patent: 4851887 (1989-07-01), Hagiwara
patent: 4908518 (1990-03-01), Losee et al.
patent: 4982252 (1991-01-01), Matsunaga
Technical Digest, IEDM, 1988, pp. 70-73.
IEEE Electron Device Letters, vol. 10, No. 8, pp. 361-363, Aug. 1989.
J. Electrochemical Soc., vol. 135, p. 2640, Oct. 1988.

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