Optics: measuring and testing – By light interference – Having shearing
Reexamination Certificate
2005-09-06
2005-09-06
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having shearing
Reexamination Certificate
active
06940606
ABSTRACT:
A wavelength detector includes an optical structure receiving an input beam, the optical structure outputting at least two wavelength dependent two-beam interference signals. Each wavelength dependent two-beam interference signal has a different phase offset. A detector receives the at least two wavelength dependent two-beam interference signals and outputs an electrical signal representative of each wavelength dependent two-beam interference. A processor receives the at least two electrical signals from the detector and generates a composite control signal. The two-beam interference signals may be created by reflecting light off the two surfaces of the optical structure. The different phase offsets may be created by providing a stepped pattern on one of the surfaces of the optical structure. Phase shifting interferometry techniques may be used to determine the wavelength from the periodic signals.
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Digital Optics Corp.
Lyons Michael A.
Morse Susan S.
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