Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-12-02
2010-12-28
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07859276
ABSTRACT:
A process for performing non-destructive monitoring of a semiconductor device that permits detection of additional circuitry that is not part of the original, intended design. This permits verification that additional circuitry, for example malicious circuitry, has not been added to the semiconductor device. In one embodiment, the monitoring is performed at the die level before the die is packaged into a complete semiconductor device. The monitoring is non-destructive so that the semiconductor die is not destroyed during the monitoring process.
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Fried Andrew T.
Johnson Nicholas K.
Stevens Rick C.
Benitez Joshua
Hamre Schumann Mueller & Larson P.C.
Lockheed Martin Corporation
Nguyen Ha Tran T
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