Non-destructive testing of cooled detector arrays

Details Non-destructive testing of cooled detector arrays Non-destructive testing of cooled detector arrays

1986-01-09

1987-11-24

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

250332, 324158D, H01J 4014

Patent

active

047091410

ABSTRACT:
An apparatus for testing an array of infrared detectors includes a number of optical switches, each of which is individually addressable with light to change its electrical characteristics. Each of the optical switches has a first side and a second side. The first side of each optical switch is adapted to receive a detector of the infrared detector array to be tested. The apparatus also includes an electrode coupled to the second side of each optical switch. Further, the apparatus includes a detector circuit coupled to the electrode and to a probe adapted to be coupled to the infrared detector array for detecting changes in the electrical characteristics of the optical switches and the infrared detector elements in response to light addressing the individual test elements.

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