Non-destructive screening device for glass diode

Details Non-destructive screening device for glass diode Non-destructive screening device for glass diode

1977-03-01

1978-11-14

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 3122

Patent

active

041258061

ABSTRACT:
A non-destructive screening device for a glass diode includes a first circuit which determines a semiconductor element is acceptable when detecting a current oscillation caused by a micro plasma oscillation arising when the semiconductor current avalanche, and a second circuit which determines that the semiconductor element is unacceptable when detecting a void discharge due to a detrimental void, when a saw tooth signal pulse, which is to be built up to a level corresponding to the avalanche operation of the semiconductor and restricted to a current from a constant current source, is applied in a reverse direction to a circuit including the semiconductor element passivated with glass and a resistor connected in series thereto. According to the above discriminating operations, a material to be inspected may be screened in a non-destructive condition.

REFERENCES:
patent: 3371276 (1968-02-01), Schiff
patent: 3979672 (1976-09-01), Arnoldi

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