Non-destructive process for continuously measuring the...

Details Non-destructive process for continuously measuring the... Non-destructive process for continuously measuring the...

2005-05-17

2005-05-17

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S070000

Reexamination Certificate

active

06895074

ABSTRACT:
A method for nondestructively measuring the density of a panel, comprising the steps of: directing a collimated radiation beam at the panel at an oblique angle; passing the panel under the collimated radiation beam or passing the collimated radiation beam over the panel; continuously detecting a resultant beam of a plurality of photons with a detector directed at the panel; counting only those photons with an energy level above a minimum energy level; correcting for inaccuracies at the edges of the panel; and generating a density profile of the panel throughout the thickness of the panel.

REFERENCES:
patent: 2997586 (1961-08-01), Scherbatskoy
patent: 4228351 (1980-10-01), Snow et al.
patent: 4918712 (1990-04-01), Le Floc'h et al.
patent: 5195116 (1993-03-01), Le Floc'h et al.
patent: 5195117 (1993-03-01), Ong
patent: 5548626 (1996-08-01), Warnecke
patent: 5729582 (1998-03-01), Ham et al.
patent: 5970116 (1999-10-01), Dueholm et al.
patent: 6094470 (2000-07-01), Teller
patent: 6563906 (2003-05-01), Hussein et al.

Affiliated with

Also associated with

Rating

Non-destructive process for continuously measuring the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-destructive process for continuously measuring the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-destructive process for continuously measuring the... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3395137