Non-destructive monitoring of material integrity

Details Non-destructive monitoring of material integrity Non-destructive monitoring of material integrity

2007-01-02

2007-01-02

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S718000

Reexamination Certificate

active

10915515

ABSTRACT:
A component which is known to have particular degradation characteristics is instrumented to provide an electrical potential across a section in which a degradation is likely to occur. The potential drop across the component is then monitored to determine when, and the degree to which, the degradation occurs. Predetermined limits are established such that when the degradation level reaches a limit, the component is repaired or replaced.

REFERENCES:
patent: 2326352 (1943-08-01), Greanslade
patent: 2368119 (1945-01-01), De Lanty et al.
patent: 2735754 (1956-02-01), Dravnieks
patent: 2964796 (1960-12-01), Press
patent: 3636441 (1972-01-01), Fujimura et al.
patent: 3721897 (1973-03-01), Edling
patent: 4656595 (1987-04-01), Hognestad
patent: 4677855 (1987-07-01), Coffin, Jr. et al.
patent: 4764970 (1988-08-01), Hayashi et al.
patent: 4800165 (1989-01-01), Oka et al.
patent: 5243298 (1993-09-01), Runner
patent: 5317925 (1994-06-01), Hayashi et al.
patent: 5728943 (1998-03-01), Colter et al.
patent: 6320391 (2001-11-01), Bui
patent: 6476624 (2002-11-01), Chuman et al.
patent: 6628111 (2003-09-01), Shapiro et al.
patent: 2003/0169058 (2003-09-01), Pierre et al.
patent: 2004/0061510 (2004-04-01), Hands
patent: 2004/0207413 (2004-10-01), Burns et al.
patent: 3434801 (1986-04-01), None
patent: 58196450 (1983-11-01), None
patent: WO 9119968 (1991-12-01), None

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