Non-destructive memory testing in computers

Details Non-destructive memory testing in computers Non-destructive memory testing in computers

1991-09-18

1996-09-10

Trammell, James P.

Excavating

371 212, 371 27, 371 251, 395180, 39518318, G01P 2900

Patent

active

055552498

ABSTRACT:
In computers, a test of memory is generally performed at the time of powering up. In one form of the invention, this type of test is run on part of Random Access Memory (RAM), while allowing data or a program to reside in another part. Then, after the partial test is completed, the data is transferred into the RAM just tested, and the RAM which previously held the data is tested. Thus, the data can co-exist in memory while the test runs, by being shuttled from one location to another.

REFERENCES:
patent: 4430727 (1984-02-01), Moore et al.
patent: 4468759 (1984-08-01), Kung et al.
patent: 4672583 (1987-06-01), Nakaizumi
patent: 4733394 (1988-03-01), Giebel
patent: 4744061 (1988-05-01), Takemae et al.
patent: 4811299 (1989-03-01), Miyazawa et al.
patent: 4868823 (1989-09-01), White, Jr. et al.
patent: 4891811 (1990-01-01), Ash et al.
patent: 4980888 (1990-12-01), Bruce et al.

Affiliated with

Also associated with

Rating

Non-destructive memory testing in computers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-destructive memory testing in computers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-destructive memory testing in computers will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1326458