Measuring and testing – Testing by impact or shock – Specimen impactor detail
Patent
1990-12-31
1992-11-24
Williams, Hezron E.
Measuring and testing
Testing by impact or shock
Specimen impactor detail
73594, G01N 330, G01N 2910
Patent
active
051652706
ABSTRACT:
The present invention features an apparatus and method for impact-echo testing of structures in situ, in the field. The impact-echo testing method provides a non-invasive, non-destructive way of determining the defects in the structure. The method is both uniform and reliable, the test procedure being substantially identical every time. The apparatus of the invention comprises a portable, hand-held unit having a plurality of impactors disposed therein. The plurality of impactors comprise a number of differently weighted spheres that are each designed to impart a different impact energy into the structure to be tested. Each sphere is disposed on a distal end of a spring-steel rod. A particular weighted sphere is chosen by a selector disposed on the testing unit. The sphere is withdrawn from the rest position by a pair of jaws to a given height above the structure. At a predetermined release point, the sphere is released, causing it to impact the structure with a specific duration and impart a given energy thereto. The impact produces stress waves that are reflected from the internal flaws and external surfaces of the structure. The reflected waves are detected by a transducer that converts the stress waves into an electrical signal (displacement waveform). The waveform is then processed to provide an amplitude spectrum, and in the case of plates, a reflection spectrum. For plates, the reflection spectrum can be interpreted by a neural network provides results that are indicative of either the thickness of the structure or of the defects disposed therein.
REFERENCES:
patent: 4177798 (1979-12-01), Leveque et al.
patent: 4519245 (1985-05-01), Evans
patent: 4682490 (1987-07-01), Adelman et al.
patent: 4711754 (1987-12-01), Bednar
patent: 4918988 (1990-04-01), Ebihara et al.
patent: 5024090 (1991-06-01), Pettigrew et al.
Pratt Donald G.
Sansalone Mary J.
Finley Rose M.
Williams Hezron E.
LandOfFree
Non-destructive materials testing apparatus and technique for us does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-destructive materials testing apparatus and technique for us, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-destructive materials testing apparatus and technique for us will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-915427