Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-12-12
2006-12-12
Mariam, Daniel (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S217000
Reexamination Certificate
active
07149339
ABSTRACT:
The present invention provides non-destructive computed tomography (CT) methods of testing downhole equipment. The non-destructive CT methods enable both extrinsic and intrinsic testing to ensure the quality of downhole components in elements such as downhole packers.
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Castano Jaime A.
Mariam Daniel
McEnaney Kevin P.
Schlumberger Technology Corporation
Van Someren, PC
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