Non-destructive inspection method and apparatus therefor

Radiant energy – Radiation tracer methods

Reexamination Certificate

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Reexamination Certificate

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07462827

ABSTRACT:
By using an image signal acquired by picking up a sample to be inspected by a color video camera, penetrant inspection and magnetic-particle inspection which are non-destructive inspections are carried out so that deficiency candidates including a pseudo deficiency are automatically detected and are displayed on a screen. A real deficiency can be detected from the deficiency candidates displayed on the screen. As image data is stored in memory means, information of a deficiency can be repeatedly reproduced on the screen. In the penetrant inspection, the chromaticity at each position on an image is acquired, a deficiency candidate is extracted based on the chrominance, and the deficiency is distinguished from a pseudo deficiency based on the differential value of the chrominance. A polarization filter is used to eliminate regular reflection originated from illumination in the penetrant inspection, and an ultraviolet-rays cutting filter is attached to the camera to prevent noise in the magnetic-particle inspection. Equipped with both a white illuminating lamp and an ultraviolet illuminating lamp, both inspections can be carried out with a single probe.

REFERENCES:
patent: 3774030 (1973-11-01), O'Connor et al.
patent: 3988530 (1976-10-01), Ikegami et al.
patent: 4978862 (1990-12-01), Silva et al.
patent: 5412219 (1995-05-01), Chappelle et al.
patent: 5494829 (1996-02-01), Sandstrom et al.
patent: 5969370 (1999-10-01), Imaino et al.
patent: 6177678 (2001-01-01), Brass et al.
patent: 6525315 (2003-02-01), Motoyama
patent: 6603126 (2003-08-01), Yamada et al.
patent: 58-82147 (1983-05-01), None
patent: 63-225153 (1988-09-01), None
patent: 1-109249 (1989-04-01), None
patent: 1-212339 (1989-08-01), None
patent: 3-181807 (1991-08-01), None
patent: 4-12258 (1992-01-01), None
patent: 4-223262 (1992-08-01), None
patent: 5-107202 (1993-04-01), None
patent: 6-50941 (1994-02-01), None
patent: 6-118062 (1994-04-01), None
patent: 6-300739 (1994-10-01), None
patent: 8-2601 (1996-01-01), None
patent: 08-184580 (1996-07-01), None
patent: 10-300688 (1998-11-01), None
patent: WO 9844336 (1998-10-01), None
Patent Abstracts of Japan, Publication No. 08184580, Publication Date—Jul. 16, 1996.

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