Non-destructive inspection method

Details Non-destructive inspection method Non-destructive inspection method

2006-09-19

2006-09-19

Aurora, Reena (Department: 2862)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S242000

Reexamination Certificate

active

07109702

ABSTRACT:
A non-destructive inspection includes: magnetizing a target by a first magnetostatic field (S2); shutting off the magnetostatic field (S3); measuring, at measurement points, the transient change of a differential magnetic flux density of a first residual magnetic field of the target (S4); obtaining a first time constant by the main time constant of the transient change at each measurement point (S5); magnetizing the target by a second magnetostatic field (S2); shutting off the second field (S3); measuring, at the measurement points, the transient change of a differential magnetic flux density of a second residual magnetic field of the target (S4); obtaining a second time constant by the main time constant of the transient change for each measurement point (S5); and obtaining information about the internal structure of the target by the distribution differences between the first and the second time constants at the measurement points (S7).

REFERENCES:
patent: 6232774 (2001-05-01), Kimura
patent: 10-26609 (1998-01-01), None
patent: 2000-227418 (2000-08-01), None
patent: 2001-165911 (2001-06-01), None
English translation of NPL document Kimura et al. “Nugget profiler” Inspection Engineering, vol. 6, No. 6, pp. 50-54 (Jun. 1, 2001).
Kimura et al. “Nugget Profiler”.Inspection Engineering, vol. 6, No. 6, pp. 50-54 (Jun. 1, 2001).

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