Non-destructive inspection apparatus

Details Non-destructive inspection apparatus Non-destructive inspection apparatus

2009-03-09

2010-12-07

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Mechanical measurement system

C073S602000, C073S866500, C702S150000

Reexamination Certificate

active

07848894

ABSTRACT:
A free-hand inspection apparatus for non-destructively inspecting a structure includes an array and an inertial sensor. The array includes a plurality of elements for transmitting and receiving inspection signals towards and from a structure being inspected. The inertial sensor measures acceleration and angular rotation rate in X, Y, and Z directions of the array.

REFERENCES:
patent: 6023986 (2000-02-01), Smith et al.
patent: 2008/0245150 (2008-10-01), Katayama et al.
Gieske, J.H., “Evaluation of scanners for C-scan imaging for nondestructive inspection of aircraft”, vol. 2, No. 11, pp. 1-12, (1997).
Analog Devices, “High precision tri-axis inertial sensor”, pp. 1-5, (2007).
Yazdi, N., et al., “Micromachined inertial sensors”, vol. 86, No. 8, pp. 1640-1659, (1998).

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