Non-destructive examination apparatus and method for guided...

Details Non-destructive examination apparatus and method for guided... Non-destructive examination apparatus and method for guided...

2011-05-10

2011-05-10

Saint Surin, Jacques M (Department: 2856)

Measuring and testing

Vibration

By mechanical waves

C073S599000, C073S602000, C073S634000, C073S642000

Reexamination Certificate

active

07938008

ABSTRACT:
A method of performing a non-destructive examination of a piece of material, having the steps of providing an angle beam wedge and at least two transducers placed upon the wedge, wherein the transducers are placed in a phased array, placing the wedge upon the piece of material to be examined, producing a guided wave into the piece of material to be examined, wherein the guided wave is placed into the material through a synthetically changed incident angle, receiving the guided wave from the piece of material, and determining one of a presence of defects and lack of defects in the piece of material from the received guided wave. Transducers used may include 360 degree guided wave, radial polarized units, parallel shear units for shear horizontal activation and guided wave wheel probes.

REFERENCES:
patent: 2779880 (1957-01-01), Malherbe
patent: 3925692 (1975-12-01), Leschek et al.
patent: 4481822 (1984-11-01), Kubota et al.
patent: 4495817 (1985-01-01), Hunt et al.
patent: 4567048 (1986-01-01), Gruetzmacher
patent: 4755975 (1988-07-01), Ito et al.
patent: 5974888 (1999-11-01), Bonitz
patent: 5992235 (1999-11-01), Fischer et al.
patent: 6360609 (2002-03-01), Wooh
patent: 6799466 (2004-10-01), Chinn
patent: 7389694 (2008-06-01), Hay et al.
patent: 2004/0093949 (2004-05-01), Alleyne
patent: 2007/0051177 (2007-03-01), Gifford et al.
patent: 2008/0229834 (2008-09-01), Bossi et al.

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