Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-01
2006-08-01
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C439S179000
Reexamination Certificate
active
07084652
ABSTRACT:
A non-destructive contact test method and apparatus for testing an electric characteristic of a test object is provided. The method includes providing an apparatus having a conductor, wherein the conductor is in a liquid state; and using the conductor to contact a surface of the test object for testing the electric characteristic of the test object. Thus, damage to the test object during the test can be effectively avoided.
REFERENCES:
patent: RE32024 (1985-11-01), Greig
patent: 5162742 (1992-11-01), Atkins et al.
patent: 5969534 (1999-10-01), Hubner et al.
patent: 02002176081 (2002-06-01), None
patent: 1983-764461 (1982-11-01), None
Guo Wen-Yuan
Meng Chao-Yu
Chan Emily Y
Liu & Liu
Nguyen Vinh
Toppoly Optoelectronics Corp.
LandOfFree
Non-destructive contact test does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-destructive contact test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-destructive contact test will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3662924