Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Patent
1991-06-07
1992-06-23
Pirlot, David L.
Electrical connectors
Preformed panel circuit arrangement, e.g., pcb, icm, dip,...
With provision to conduct electricity from panel circuit to...
439487, 439 68, 324158F, H05K 100
Patent
active
051238500
ABSTRACT:
Disclosed is a burn-in test socket which serves as a temporary package for integrated circuit die, multichip hybrid or a complete wafer without damaging the bonding pads or insulating passivation on the die during test and burn-in.
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patent: 4341842 (1980-07-01), Cutchaw
patent: 4597617 (1986-07-01), Enochs
patent: 4679118 (1987-07-01), Johnson et al.
patent: 4859189 (1989-08-01), Peterson et al.
patent: 4922376 (1990-05-01), Pommer et al.
Elder Richard A.
Frew Dean L.
Johnson Randy
Wilson Arthur M.
Barndt B. Peter
Donaldson Richard L.
Pirlot David L.
Texas Instruments Incorporated
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