Non-contacting capacitance probe for dielectric cure monitoring

Details Non-contacting capacitance probe for dielectric cure monitoring Non-contacting capacitance probe for dielectric cure monitoring

1992-09-14

1995-07-25

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324688, 324690, G01R 2726

Patent

active

054365651

ABSTRACT:
Conductive measuring electrodes, of a capacitive probe having a grounded rd electrode positioned therebetween shield a probe circuit, provides mutual capacitance measurements which way as a function of changes in impedance of dielectric material being monitored as it undergoes a curing process. The probe is positioned in non-embedded relation to the dielectric material to form a sensitivity region therein through which an electric field extends between the conductive measuring electrodes of the probe to establish said variable mutual capacitance measurements without extraneous influences.

REFERENCES:
patent: 3694742 (1972-09-01), Bergmanis et al.
patent: 3761805 (1973-09-01), Dornberger
patent: 3781672 (1973-12-01), Maltby et al.
patent: 3826979 (1974-07-01), Steinmann
patent: 4723908 (1988-02-01), Kranbuehl
patent: 4766369 (1988-08-01), Weinstein
patent: 4817021 (1989-03-01), Sowerby et al.
patent: 4845421 (1989-07-01), Howarth et al.

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