Non-contact voltage probe apparatus

Details Non-contact voltage probe apparatus Non-contact voltage probe apparatus

1996-04-04

1999-09-07

Oda, Christine K.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324544, G01R 3102

Patent

active

059492309

ABSTRACT:
A non-contact voltage probe is used to measure the voltage of electromagnetic interference developed in a cable or the like electrically connected to pieces of electronic equipment. The non-contact voltage probe has double coaxial cylindrical-type inner and outer electrodes through which a cable or the like is passed. The inner electrode is electrically connected to a voltage detector, which measures the voltage induced by the capacitance between the inner electrode and the cable passing there through, and the outer electrode is grounded.

REFERENCES:
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patent: 4052665 (1977-10-01), Gruenwald
patent: 4387336 (1983-06-01), Joy
patent: 5311116 (1994-05-01), Rogers
patent: 5337261 (1994-08-01), Rogers
G.F. Turnbull et al., "Voltmetre Alternatif A Machoires Sans Contact" Le Journal De L'Equipment Electrique, pp. 177 and 119, Nov. 1966.
Kwang-Ta Huang, "Transient Source Detector for a Three-Phase System," Navy Tech. Discl. Bulletin, v. 10, n. 1, Sep. 1984, pp. 21-25.
Andreas Schutte et al., "Comparison of Time and Frequency Domain Electromagnetic Susceptibility Testing," Record of the Int'l Symp. on Electromagnetic Compatibility (EMC), Aug. 22-26, 1994, pp. 64-67.
"Study for no-contact measurement method of common-mode interference voltage" Fukuoka Institute of Technology Mar. 27-30, 1995, Kobayashi et al., p. 294.
"Transmission route searching method for conducted interference" Chuo Unversity, Sep. 5-8, 1995 Kobayashi et al., p.173.
"Transmission Route Searching Method for Conducted Interference by Measuring its Energy" EMCJ95-69-75 Dec. 15, 1995, IECE Tech. Report, Kobayashi et al pp. 7-13.
"Fundamental study for transmission route searching method of impulse conducted noises" Tokyo Institute of Tech., Mar. 28-31, 1996, Kobayashi et al., p. 319.

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