Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Using radiant energy
Patent
1993-07-19
1995-11-07
Nguyen, Vinh P.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Using radiant energy
324750, 324753, G01R 1900
Patent
active
054650437
ABSTRACT:
To enable the measurement of the absolute voltage of the wiring under test with no cross-talk and without depending on the gap interval between the probe tip and-the wiring under test. [Construction of the Invention]
The voltage of the conductive films 22 to 24 are controlled by the feedback circuit 55 so that the output of the differential amplifier 52 is equal to zero, for example. No external electric field is applied to the pinhole h, and the voltages of the conductive film and the wiring under test 12 are equal to each other.
The variation in polarization of the measuring light in the electrooptic material 21 is detected as a difference in potential occurring in the electrooptic material 21, and the voltage of the wiring under test 12 is measured on the basis of the difference in potential. Since the voltage of the conductive film is compared with the voltage of the wiring under test, even when an error occurs in distance between the non-contact type probe 20C and the circuit under test 10, this error does not appear as an error for the voltage measurement, and thus the voltage of the wiring under test 12 can be measured with high precision.
REFERENCES:
patent: 4145109 (1979-03-01), Nelson
patent: 4182544 (1980-01-01), McMahon
patent: 4841234 (1989-06-01), Aoshima et al.
patent: 4891580 (1990-01-01), Valdmanis
patent: 4920310 (1990-04-01), Aoshima et al.
patent: 4982151 (1991-01-01), Takahashi et al.
J. F. Whitaker, et al., "External Electro-Optic Probing of Millimeter-Wave Integrated Circuits", IEEE, MTT-S Digest, 1989, pp. 221-224.
M. Shinagawa, et al., "Electro-Optic Sampling Using an External GaAs Probe Tip", Electronics Letters, Aug. 16, 1990, vol. 26, No. 17, pp. 1341-1343.
S. Aoshima, et al., "Non-Contact Picosecond Electro-Optic Sampling Utilizing Semi-Conductor Laser Pulses", SPIE, vol. 1155, Ultrahigh Speed and High Speed Photography, Photonics and Videography, 1989, pp. 499-510.
Siegfried Gorlich, "Electron beam testing versus laser beam testing", Microelectronic Engineering, Mar. 16, 1992, Nos. 1/4, Amsterdam, NL, pp. 349-366.
Kees de Kort, and Joris J. Vrehen, "Waveform Measurements with Calbrated Amplitude by Electro-Optic Sampling in IC's", Microelectronic Engineering, Mar. 16, 1992, No. 1/4, Amsterdam, NL, pp. 341-348.
F. Taenzler, and E. Kubalek, "Use of polymeric materials for external electro-optic probing", Microelectronic Engineering, Mar. 16, 1992, Nos. 1/4, Amsterdam, NL., pp. 325-332.
F. H. Babai, R. B. Dyott, E. A. D. White, "Crystal growth of organic materials in glass capillaries", Journal of Materials Science, vol. 12, pp. 869-872.
Hewlett--Packard Company
Nguyen Vinh P.
LandOfFree
Non-contact type probe and non-contact type voltage measuring ap does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-contact type probe and non-contact type voltage measuring ap, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-contact type probe and non-contact type voltage measuring ap will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-199065