Non-contact type microdisplacement meter

Details Non-contact type microdisplacement meter Non-contact type microdisplacement meter

1981-09-21

1984-05-29

Krawczewicz, Stanley T.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

324 61P, G01R 2726

Patent

active

044517807

ABSTRACT:
In a non-contact type microdisplacement meter, two electrodes different in area are confronted with an object under measurement to form two electrostatic capacitances between the object and the electrodes, and the capacitances are coupled to two oscillator circuits, so that a displacement signal is provided as the frequency difference between the oscillator circuit, thereby to measure the very small displacement of the object.

REFERENCES:
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patent: 3221256 (1965-11-01), Walden
patent: 3764899 (1973-10-01), Peterson et al.
patent: 4025846 (1977-05-01), Franz et al.
patent: 4112355 (1978-09-01), Gibson, Jr. et al.
patent: 4227182 (1980-10-01), Ogasawara et al.
patent: 4238782 (1980-12-01), Ogasawara
patent: 4297634 (1981-10-01), Ogasawara et al.
patent: 4300093 (1981-11-01), Ogasawara et al.
patent: 4301401 (1981-11-01), Roof et al.
patent: 4347478 (1982-08-01), Heerens et al.

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