Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-07-12
2010-06-29
Natalini, Jeff (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S072500
Reexamination Certificate
active
07746086
ABSTRACT:
Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.
REFERENCES:
patent: 5218294 (1993-06-01), Soiferman
patent: 5517110 (1996-05-01), Soiferman
patent: 7003412 (2006-02-01), Jensen et al.
patent: 7629796 (2009-12-01), Eun et al.
patent: 2002/0079458 (2002-06-01), Zur
patent: 2003/0083537 (2003-05-01), Ardizzone
patent: 0 581 556 (1994-02-01), None
patent: A-08-146046 (1996-06-01), None
patent: A-08-160080 (1996-06-01), None
Cho Woo Chul
Choi Hee Dok
Eun Tak
Kim Seong Jin
Lee Dong Jun
Microinspection Inc.
Natalini Jeff
Oliff & Berridg,e PLC
LandOfFree
Non-contact type apparatus for testing open and short... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Non-contact type apparatus for testing open and short..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-contact type apparatus for testing open and short... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4249014