Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1997-03-17
1999-02-09
Gutierrez, Diego F. F.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374 9, 374 45, 374129, 374 6, 364557, 364564, 25033904, G01J 500
Patent
active
058684964
ABSTRACT:
Method and apparatus for non-contact temperature, emissivity and area estimation for gray and non-gray (uniform and non-uniform surface emissivity) are disclosed. Optical power measurements are obtained for radiation from a surface of interest in multiple wavelength bands. These power measurements are used to generate an expression for surface emissivity as a function of unknown temperature and surface projected area. At each of series of trial temperatures and areas within a predetermined range of physically plausible values, a value for emissivity at each measured wavelength is obtained. A best fit between these emissivity data points and a selected model emissivity function is obtained by least-squares minimization. The trial temperature and area which yield both the smallest minimum sum of squares and an emissivity value within predetermined physical constraints are concluded to be the temperature and projected surface area. An expression for the emissivity of the surface as a function of wavelength is also thus obtained. The invention applies as well for the case when the surface of interest has a known area. The invention includes a means of correcting for reflected background radiation by modeling it as part of the measured optical power at each measurement wavelength. Optical power measurements are taken in the environment of the surface from a calibration source having a known temperature and known emissivity characteristics, thus allowing the background radiation source effects to be characterized and excluded from the temperature estimation.
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Gutierrez Diego F. F.
Hirshfeld Andrew
Massachusetts Institute of Technology
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